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ArcLine Detector

Arc (elliptical and circular arcs) and Line Segment Detection (ALD) refers to jointly detecting line segment, elliptical arc and circular arc primitives in images for various image analysis applications. Detecting image structures may simplify many image processing applications like object detection, tracking, image segmentation, etc. In saiwa ALD service, using a statistical algorithm which is called ELSDc, a fast and reliable algorithm, circular arcs, elliptical arcs and line segments are extracted from input image(s). For more information about ELSDc algorithm and its technical details, please refer to ALD white paper.

saiwa Arc and Line segment Detection service has advantages like:


  • An fast and accurate method
  • Reduced number of false detections without any parameter tuning
  • Manually modifying parameters for customizing the algorithm upon interest
  • Image aggregation to apply the algorithm on several images at once
  • Preview and download the resulting images
  • Exporting and archiving the results in user cloud space or locally
  • Service customization by saiwa© team using “Request for customization” option

    Elliptical arc, circular arc and line segment detection has applications like:
    1. Industrial applications like automatic inspection of manufactured products
    2. Sporting events analysis
    3. Medical applications like pupil and iris detection
    ;4. Camera calibration using geometric patterns
    5. Urban applications like circular traffic sign detection


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